Date of Award
Spring 2014
Degree Type
Honors Project
School
College of Liberal Arts
First Advisor
Michael Kevin Stanley
Abstract
Using field emission data obtained from 11 etched Tungsten successful field emission tips of radius about 20 to 100 nanometers, FN type linear models were compared. The emission tip radii were determined using an iteration method derived from the modified FN linear equation. In addition, Scanning Electron Microscopy images of 5 successful emitters were obtained. These images were fit to a circular model to estimate the actual radius and compared to empirically predicted radius values. A hyperbolic model was further fit to the images and the circle of similar apex curvature was derived. A method for calculating the electric field for these modelled geometries was suggested and a sample code has been provided for future research.
Recommended Citation
Reeves, Emma C., "Comparison of the Sharpness of Tungsten Field Emission Tips from Traditional Electrical Characterization to Tip Geometries Imaged by Scanning Electron Microscopy" (2014). Departmental Honors Projects. 15.
https://digitalcommons.hamline.edu/dhp/15
dc_type
text
dc_publisher
DigitalCommons@Hamline
dc_format
application/pdf
dc_source
Departmental Honors Project